Tescan XEIA3 PFIB

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Overview

Tescan XEIA3 PFIB

Tescan XEIA3 GMH Integrated FIB-FESEM

  • Triglav UHR Electron Column
  • Orsay Physics i-FIB Xenon Plasma Column
  • In-Beam SE, In-Beam BSE, SE, Retractable YAG BSE detectors
  • In-Chamber CCD
  • High-Speed Electrostatic Beam Blanker
  • Mono GIS with C or W included
  • Windows 10

Additional Options:

  • Additional Mono GIS chemistries
  • Integrated EDS and EBSD detectors

*Installation outside of North America will be quoted separately

Included With Instrument

180 day warranty from TSS Microscopy 180 Day Warranty Training Basic Operational Training installation by tss microscopy included Installation Included

Optional Upgrades and Services

Annual Service Contracts Available Annual Service Contracts Advanced Apps Training Available Advanced Apps Logistics Available Logistics Available
Maintenance and Servicing

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