Consumables

TSS Microscopy provides consumables – including sources, detectors and cables – for FEI DualBeam, SEM, TEM, FIB. Please contact us with your instrument model so we can provide you with a quotation.

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Consumables
8 Results
Model
Description
New in packaging, direct OEM replacement.  Proudly made in the USA. For use in FEI / TFS Ion Columns Pre-Lens Ion Column Magnum Ion Column Sidewinder Ion Column Tomahawk Ion Column Phoenix Ion Column  
New CDEM for FEI FIB and Dual Beam Note, this is the Bullet round style.  There is another style which is more square.  We have the square style detector too!  
FEI GIS assembly (tested and working) for FIB and Dual Beam Refilled crucibles available.  All except IEE ready for plug-n-play crucible change Pt IDEP II EE IEE complete refill/GIS swap availably Please contact us for […]
New in packaging, direct OEM replacement.  Proudly made in the USA. For use in FEI / TFS Ion Columns: Magnum Ion Column Sidewinder Ion Column 21nA Sidewinder Ion Column 65nA Tomahawk Ion Column 65nA Phoenix […]
NEW LMIS for use in FEI / Thermo Fisher Ion Columns Ga69 Single isotopic Ga 69/71 multi isotopic For use in Pre-Lens Ion Column Magnum Ion Column Sidewinder Ion Column Tomahawk Ion Column Phoenix Ion […]
NEW Aperture Strips for FEI / Thermo Fisher Ion Columns Aperture Strips can be standard configuration or custom For use in Pre-Lens Ion Column Magnum Ion Column Sidewinder Ion Column Tomahawk Ion Column Phoenix Ion […]