FEI Helios NanoLab 400S

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Overview

FEI Helios NanoLab 400S

(TSS#7326) This 2015 Helios NanoLab 400S DualBeam with STEM is used for TEM lamella prep, circuit edit front & back, defect/failure analysis, nanofabrication and nanoprototyping. It has been remanufactured to original OEM specifications and includes:

  • Elstar UHR Electron Column
  • Electron beam voltage: 350V to 30kV
  • Sidewinder Ion Column
  • Ion beam voltage: 0.5 to 30kV, beam current 1.5pA to 21nA
  • TLD, ETD, CDEM, STEM detectors
  • Full piezo UHR stage with flip stage
  • In-chamber CCD
  • Omniprobe 200
  • Gas Injection System: Max 4 injectors, 1 included, Pt or W
  • Vacuum System, oil free consisting of 3 IGPs, water-cooled turbo and dry PVP
  • Includes installation and operational training in North America*

Additional Options:

  • Additional GIS chemistries (IEE, EE, C, Pt, W, H20, IDEP)
  • Plasma Cleaner
  • Integrated EDS and EBSD detectors

*Installation outside of North America will be quoted separately

Included With Instrument

Training Basic Operational Training 180 day warranty from TSS Microscopy 180 Day Warranty

Optional Upgrades and Services

Annual Service Contracts Available Annual Service Contracts Preventive Maintenance Visits Preventive Maintenance On Demand Service Contacts On Demand Service
Maintenance and Servicing

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